Introduction to Scanning Tunneling MicroscopyOxford University Press, 1993 - 412 Seiten Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics. |
Inhalt
List of Figures | xvii |
Gallery of STM Images | xxiv |
1 Overview | 1 |
IMAGING MECHANISM | 51 |
INSTRUMENTATION | 211 |
Real wavefunctions | 343 |
Greens functions | 347 |
Spherical modified Bessel functions | 349 |
Twodimensional Fourier series | 353 |
Plane groups and invariant functions | 357 |
Elementary elasticity theory | 365 |
A short table of Laplace transforms | 377 |
Operational amplifiers | 379 |
383 | |
405 | |
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Häufige Begriffe und Wortgruppen
apex atom apparent barrier height approximation atomic force atomic resolution Bardeen beam bias Binnig Bloch Bloch functions Bloch wave cantilever Chapter charge density coefficients constant contour corrugation amplitude current amplifier curve dangling bonds deflection deformation diffraction effect electronic structure energy level example experimental factor feedback Feenstra Fermi level Fermi-level LDOS field-emission first-principles calculations Fourier graphite Green's function hydrogen molecular ion jellium jellium model lattice measured mechanical metal surface method microscopy molecules º º observed obtained op-amp permission perturbation piezo piezoelectric piezoelectric effect plane groups plate Reproduced from Chen s-wave sample surface sample wavefunction Scanning Tunneling Microscopy Schrödinger equation shown in Fig solution spherical spherical harmonics STM and AFM STM experiments STM images symmetry temperature Tersoff theory tip wavefunction tip-sample distance topographic image tube scanner tunneling conductance tunneling current tunneling matrix element tunneling spectra tunneling spectroscopy typical vacuum voltage wavefunctions