Transmission Electron Microscopy Studies of Nucleation, Growth and Interfaces in Ceramic Oxide HeterojunctionsCornell University, 1991 - 540 Seiten |
Inhalt
kinks on a surface step | 124 |
IMAGING AND DIFFRACTION STUDY | 131 |
5 | 152 |
Urheberrecht | |
4 weitere Abschnitte werden nicht angezeigt.
Häufige Begriffe und Wortgruppen
alumina Appl BF image Burgers vectors C. B. Carter chemical vapor deposition corresponding SAD pattern corundum D. K. Lathrop defects deposition edge dislocations Electron Diffraction epitactic Epitaxial exact coincidence formed grain boundaries hematite film hematite islands heterojunctions interface structure intermediate layer lattice misfit Lett low-index planes LPCVD microstructure misfit dislocation network moiré fringes moiré pattern morphology N2 network nm Figure nucleation observed orientation relationship orthorhombic oxygen parallel partial dislocation Phil Phys present study Proc R. A. Buhrman reflections rhombohedral rotation Russek and R. A. S. E. Russek S. R. Summerfelt SAD pattern recorded sapphire substrate schematic shown in fig shows specimen stacking fault sublattice substrate materials substrate orientations substrate surface Summerfelt and C. B. superconducting surface steps Susnitzky Symp temperature Thin Films thin-foil substrate Tietz tilt Transmission Electron Microscopy triangular pyramid twin boundaries types of misfit unit cell vapor WBDF image weak-beam imaging YBCO thin films zone axis