Optical Shop TestingDaniel Malacara John Wiley & Sons, 03.08.2007 - 888 Seiten The purpose of this third edition is to bring together in a single book descriptions of all tests carried out in the optical shop that are applicable to optical components and systems. This book is intended for the specialist as well as the non-specialist engaged in optical shop testing. There is currently a great deal of research being done in optical engineering. Making this new edition very timely. |
Inhalt
| 1 | |
Chapter 2 TwymanGreen Interferometer | 46 |
Chapter 3 CommonPath Interferometers | 97 |
Chapter 4 Lateral Shear Interferometers | 122 |
Chapter 5 Radial Rotational and Reversal Shear Interferometer | 185 |
Chapter 6 MultipleBeam Interferometers | 219 |
Chapter 7 MultiplePass Interferometers | 259 |
Chapter 8 Foucault Wire and Phase Modulation Tests | 275 |
Chapter 12 Testing of Aspheric Wavefronts and Surfaces | 435 |
Chapter 13 Zernike Polynomial and Wavefront Fitting | 498 |
Chapter 14 Phase Shifting Interferometry | 547 |
Chapter 15 Surface Profilers Multiple Wavelength and White Light Intereferometry | 667 |
Chapter 16 Optical Metrology of Diffuse Surfaces | 756 |
Chapter 17 Angle Prisms Curvature and Focal Length Measurements | 808 |
Chapter 18 Mathematical Representation of an Optical Surface and Its Characteristics | 832 |
Appendix Optical Testing Programs | 852 |
Chapter 9 Ronchi Test | 317 |
Chapter 10 Hartmann HartmannShack and Other Screen Tests | 361 |
Chapter 11 Star Tests | 398 |
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Häufige Begriffe und Wortgruppen
algorithm amplitude angle aperture Appl aspheric aspheric surface astigmatism autocollimator beam splitter center of curvature coefficients coherence collimated coma compensator concave conic constant convex Creath defocusing described detector diffraction displacement distance error Fabry–Perot Fizeau interferometer focus frequency fringe pattern glass grating Hariharan Hartmann hologram holographic illumination intensity interference fringes interferogram laser lateral shearing interferometer lens light source Malacara measurement method microscope mirror modulation moire multiple-beam null null corrector object obtained optical axis optical path optical surface optical system orthogonal paraboloid path difference phase shift Phase Unwrapping pinhole pixel plane polarized prism Proc pupil radial shear interferometer radius of curvature reflected refractive Ronchi test rotation sample scanning Schwider screen shearing interferometer shown in Figure spatial speckle spherical aberration SPIE surface under test symmetric techniques test surface tilt wave wavefront wavelength white light Wyant Zernike polynomials zero